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Influence of trench structures induced by texturization on the breakdown voltage of multicrystalline silicon solar cells

 
: Nievendick, J.; Kwapil, W.; Rentsch, J.

:

IEEE Electron Devices Society:
37th IEEE Photovoltaic Specialists Conference, PVSC 2011 : 19-24 June 2011, Seattle, WA, USA
Piscataway: IEEE, 2011
ISBN: 978-1-4244-9966-3
ISBN: 978-1-4244-9965-6 (print)
S.002913-002917
Photovoltaic Specialists Conference (PVSC) <37, 2011, Seattle/Wash.>
Englisch
Konferenzbeitrag
Fraunhofer ISE ()
PV Produktionstechnologie und Qualitätssicherung; Silicium-Photovoltaik; Produktionsanlagen und Prozessentwicklung

Abstract
Preferred grain boundary etching during acidic texturization of mc-Si wafers causes the formation of deep and sharp trench structures. This paper shows that their depth and sharpness directly influence the breakdown voltage at critical locations. This finding can be explained by the electric field enhancement at the curved tip of the etch pits, superposing the strong electric field surrounding the metal precipitates which are due to Schottky contact formation. This paper shows that it is possible to engineer the breakdown behavior in critical material by choosing an appropriate texturization method.

: http://publica.fraunhofer.de/dokumente/N-208788.html