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PZT multilayer films: Modeling polarization effects caused by microstructural inhomogeneities

: Roedel, J.; Beckert, W.; Kreher, W.S.


Bartolomeo, E. di:
ELECTROCERAMICS VIII'02 : Rome, Italy, 25 - 28 August 2002. Refereed reports. Presented at the 8th International Conference on Electronic Ceramics and their Applications
Amsterdam: Elsevier, 2004 (Journal of the European Ceramic Society 24.2004,6)
International Conference on Electronic Ceramics and their Applications (ELECTROCERAMICS) <8, 2002, Roma>
Konferenzbeitrag, Zeitschriftenaufsatz
Fraunhofer IKTS ()
model; finite element analysis; ferroelectric materials; film; PZT

PZT films on a substrate are of interest for application as a ferroelectric printing form. Owing to the difficult preparation conditions, such films contain inhomogeneities such as pores or glassy inclusions in the range 10-50 µm, which may lead to faulty printing properties. These effects are caused by a locally varying electric surface potential and depend on the size, depth and properties of the inhomogeneities. In this paper we present results of different electric field calculations, especially those for films containing pores. The model is based on a linear piezoelectric finite element analysis ta king into account the variation of dielectric and remnant polarization properties. The deterioration of surface potential caused by the heterogeneities may be smoothed by an additional thin film surface layer.