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Capability management framework for clinical equipment in laboratory

 
: Dreiss, P.; Muckenhirn, R.; Dorner, J.; Kumar, A.P.

Association for Laboratory Automation:
LabAutomation 2004. Final Program & Abstracts : The premier international conference on laboratory automation. February 1-5, 2004, San Jose, California, USA
San Diego, CA, USA, 2004
S.159
International Conference on Laboratory Automation (LabAutomation) <1, 2004, San Jose/Calif.<
Englisch
Konferenzbeitrag
Fraunhofer IPA ()
Capability Management Framework (CMF); Laboratorium; Laboratoriumseinrichtung; Halbleiter

Abstract
The Capability Management Framework (CMF) system provides predefined and configurable sets of developed software components for the examination and evaluation of analysis results based on system and process capability patterns during the analysis process. CMF takes into account all the analysis steps and the machine parameters, which are necessary for the analysis to recognize the non-trivial coherence among the system, process capabilities and the related parameters, which can be responsible for the origination of system, process based system. CMF as an object-oriented framework can be used for a rapid development and integration of capability management based services within a clinical environment for scheduling and dispatching. These services extend the current features of Laboratory Information Management Systems (LIMS). The following presentation will depict the associated devevelopment process and the corresponding integration of its components in the existing software architectures and services for how to setup communication. It includes the basic framework elements, services and its integration to the other already existing software architectures. The main topics are the basic software components and the underlying communication infrastructure and protocols that support during a rapid setup and configuration process. Further the concepts for service registration and discovery in the context of the clinical environment are pointed out. The concept is shown by an implementation based for several equipment types as used in semiconductor manufacturing and pharmaceutical industries.

: http://publica.fraunhofer.de/dokumente/N-20609.html