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Safe product design - the role of the NDE reliability analysis

 
: Pavlovic, Mato; Ronneteg, Ulf; Müller, Christina; Ewert, Uwe; Boller, Christian

:
Postprint urn:nbn:de:0011-n-2021239 (340 KByte PDF)
MD5 Fingerprint: 4e057914a10693d3395773cf8114bcff
Erstellt am: 8.5.2012


South-African Insitute for Non-Destructive Testing -SAINT-:
18th World Conference on Non-Destructive Testing 2012. Proceedings. CD-ROM : WCNDT 2012, 16 - 20 April 2012, Durban, South Africa
Lynnwood Ridge: SAINT, 2012
ISBN: 978-0-620-52872-6
9 S.
World Conference on Non-Destructive Testing (WCNDT) <18, 2012, Durban>
Englisch
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IZFP ()
reliability; Probability of Detection (POD); multiparameter; ultrasonics; transmit receive longitudinal (TRL)

Abstract
When pushed to the limits of their detection capability, NDE systems do not produce consistent hit/miss indications. Their capability of detecting small defects is therefore expressed in terms of POD. An adequate NDE system is required to ensure the structural integrity. In conventional signal response analysis, the POD is expressed as a function of the defect size, and its adequacy for the inspection task is tested against the maximum allowable defect size which will not undermine the structural integrity. Analyses of modern structures show that other parameters, beside the defect size, can both significantly influence the POD and determine the severity of the defect for the structure. Within the multi-parameter reliability analysis, the POD is expressed as a function of those influencing parameters. When determining the adequacy of the NDE system, the capability of detecting a defect has to be expressed and tested against the critical value of exactly that parameter that determines defects severity for the structure. Failing to do so can lead to a rejection of the healthy, or acceptance of the bad part. The principle is demonstrated on the example of the Transmit-Receive Longitudinal (TRL) ultrasonic inspection of the iron cast component for semi-elliptical surface defects.

: http://publica.fraunhofer.de/dokumente/N-202123.html