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Luminescence of UV thin films

 
: Heber, J.; Mühlig, C.; Triebel, W.; Danz, N.; Thielsch, R.; Kaiser, N.; Lewis, K.L.; Soileau, M.J.; Stolz, C.J.

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Exarhos, G.J. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.; Lawrence Livermore National Laboratory; Wissenschaftliche Gesellschaft Lasertechnik -WLT-:
Laser-induced damage in optical materials 2002. Proceedings : 34th Boulder Damage Symposium, 16 - 18 September 2002, Boulder, Colorado, 7th International Workshop on Laser Beam and Optics Characterization, 18 - 19 September 2002, Boulder, Colorado
Bellingham/Wash.: SPIE, 2003 (SPIE Proceedings Series 4932)
ISBN: 0-8194-4727-7
S.269-275
International Workshop on Laser Beam and Optics Characterization (LBOC) <7, 2002, Boulder/Colo.>
Annual Boulder Damage Symposium <34, 2002, Boulder/Colo.>
Symposium on Optical Materials for High-Power Lasers <34, 2002, Boulder/Colo.>
Englisch
Konferenzbeitrag
Fraunhofer IOF ()
luminescence; UV thin film; color centers; 193 nm

Abstract
Luminescence measurements have been set up in order to study the interaction of UV-laser radiation with dielectric thin films. The pulsed laser excitation was carried out at 193-nm (6.4eV), the coating materials compr ised wide-band-gap oxides and fluorides. Experiments show the significant optical response of single- and multilayer coatings on the low fluence excitation at sub-band-gap energy. Time- and spectrally-resolved measurements indicate characteristic emission bands of color centers in the deep-UV and vacuum-UV coating materials. An a signment of these optical transitions can be derived from the comparison with known bulk-material studies.

: http://publica.fraunhofer.de/dokumente/N-19906.html