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Electromagnetic near-field scanning in time and frequency domain for EMI characterisation
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2010
Conference Paper
Titel
Electromagnetic near-field scanning in time and frequency domain for EMI characterisation
Author(s)
Mager, T.
Reinhold, C.
Hedayat, Christian
Schubert, G.
Hauptwerk
Smart systems integration 2010. 4th European Conference & Exhibition on Integration Issues of Miniaturized Systems - MEMS, MOEMS, ICs and Electronic Components. CD-ROM
Konferenz
European Conference & Exhibition on Integration Issues of Miniaturized Systems - MEMS, MOEMS, ICs and Electronic Components 2010
Language
English
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Fraunhofer-Institut für Elektronische Nanosysteme ENAS