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Investigations of single event effects with heavy ions of energies up to 1.5 GeV/n

 
: Höffgen, Stefan Klaus; Durante, Marco; Ferlet-Cavrois, Veronique; Harboe-Sorensen, Reno; Lennartz, Wilhelm; Kündgen, Tobias; Kuhnhenn, Jochen; LaTessa, Chiara; Mathes, Markus; Menicucci, Alessandra; Metzger, Stefan; Nieminen, Petteri; Pleskac, Radek; Poivey, Christian; Schardt, Dieter; Weinand, Udo

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Preprint urn:nbn:de:0011-n-1958788 (60 KByte PDF)
MD5 Fingerprint: 743070cf7c8be017f6e0992608e8d210
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Erstellt am: 7.3.2012


Institute of Electrical and Electronics Engineers -IEEE-; European Space Agency -ESA-, Paris; Instituto Nacional de Tecnica Aeroespacial -INTA-:
12th European Conference on Radiation and its Effects on Components and Systems, RADECS 2011. Proceedings : Sevilla, Spain, 19 - 23 September 2011
Piscataway/NJ: IEEE, 2011
ISBN: 978-1-4577-0585-4
ISBN: 1-4577-0585-0
ISBN: 978-1-4577-0587-8
S.711-715
European Conference on Radiation and its Effects on Components and Systems (RADECS) <12, 2011, Sevilla>
Englisch
Konferenzbeitrag, Elektronische Publikation
Fraunhofer INT ()
single event effects; heavy ions; nuclear reaction; indirect ionization; energy effects

Abstract
The ESA SEU-Monitor, a DDR2 SDRAM and a power MOSFET have been irradiated at GSI with ions of energies from 80 to 1500 MeV/n. The results are compared to low energy (< 50 MeV/n) data.

: http://publica.fraunhofer.de/dokumente/N-195878.html