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Electronic transport properties of copper atomic wires

: Mohammadzadeh, S.; Streiter, R.; Gessner, T.

Edelstein, D.C. (Hrsg.) ; Materials Research Society -MRS-; Univ. of California, Continuing Education in Engineering:
Advanced Metallization Conference, AMC 2009 : Proceedings of the conference held October, 13 - 15, 2009, Baltimore, Maryland, U.S.A.
Warrendale, Pa.: MRS, 2009
ISBN: 978-1-605-11218-3
Advanced Metallization Conference (AMC) <26, 2009, Baltimore/Md.>
Fraunhofer ENAS ()

Based on the non-equilibrium Green's function density functional tight binding method, electronic transport properties of copper atomic wire through (001) direction have been analyzed. Numerical calculations suggest that transport properties behave relatively similar and independently from the wire length and depend strongly on the geometry defects if the wire length approaches to atomic dimensions.