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High resolution measurements to determine the permittivity in artificial structures

 
: Krebs, C.; Rubart, J.; Hommes, A.; Brauns, R.; Nüßler, D.

:

Institute of Electrical and Electronics Engineers -IEEE-:
35th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2010 : 5-10 Sept. 2010, Rome, Italy
Piscataway/NJ: IEEE, 2010
ISBN: 978-1-4244-6655-9
ISBN: 978-1-4244-6657-3 (print)
2 S.
International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) <35, 2010, Rome>
Englisch
Konferenzbeitrag
Fraunhofer FHR

Abstract
The characterization of materials is one major task for systems which work e.g. in the field of quality or production control. One factor to analyze material volume information is the permittivity. The following paper describes a measurement method to determine and gives an overview about the measurement system. In addition first measurement results will be shown.

: http://publica.fraunhofer.de/dokumente/N-188612.html