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White spot analysis

The potential of patent information for research and development
 
: Siwczyk, Yvonne; Warschat, Joachim

Kocaoglu, Dundar F. (Ed.) ; Portland International Center for Management of Engineering and Technology -PICMET-:
PICMET 2011. Technology management in the energy smart world. Proceedings : Portland, Oregon, USA, 31 July - 4 August 2011
Piscataway, NJ: IEEE, 2011
ISBN: 978-1-4577-1552-5
ISBN: 978-1-890843-23-6
ISBN: 1-890843-24-5
ISBN: 978-1-890843-24-3
Art. 6017837, 9 S.
Portland International Conference on Management of Engineering and Technology (PICMET) <2011, Portland/Or.>
Englisch
Konferenzbeitrag
Fraunhofer IAO ()

Abstract
Patents do not only offer legal protection, but also provide an extensive source of technical information: preprocessed in "technology maps" or "patent maps", interesting technical details can be identified for the own development of new product ideas and business opportunities. The White Spot Analysis presented in this paper is based on a special patent map: building a problem solution matrix of patent data within a defined technology field, gaps - so called White Spots - can be identified, which lead to new business opportunities not described through patents yet. The manual analysis of numerous patents is very time consuming and thus very expensive. The approach presented in this paper utilizes a text mining based method in order to support the extraction of problems and solutions from patent text. For the purpose of identifying only White Spots with a high economic attractiveness, a special assessment method is combined with the patent data analysis process. The detailed process steps of the White Spot Analysis will be shown by a practical example regarding Electric Mobility, especially battery management systems for electric and hybrid cars.

: http://publica.fraunhofer.de/dokumente/N-184872.html