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2003
Conference Paper
Titel
Microscopic characterization of technical magnetic materials by the photothermally modulated stray field technique
Abstract
The photothermally modulated stray-field (PMS) technique is used to image magnetic structures of ferri- and ferromagnetic materials with a few micrometer resolution. As detector for the thermally induced modulated magnetic stray-fields, miniaturized coils and sensors based on magnetoresitive effects are used. The technique is applied to image domain structures in amorphous metallic alloys. A unique property of the PMS technique is the ability for magnetic depth profiling, which is demonstrated for polycrystalline pure nickel. Practical advantages are the small lift-off effect and the low sample preparation requirements.