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Microscopic characterization of technical magnetic materials by the photothermally modulated stray field technique

 
: Netzelmann, U.; Kloster, A.; Wang, J.

Green, R.E.; Djordjevic, B.B.; Hentschel, M.P ; Bundesanstalt für Materialforschung und -prüfung -BAM-, Berlin; Deutsche Gesellschaft für Zerstörungsfreie Prüfung e.V. -DGZfP-, Berlin; Center for Nondestructive Evaluation -CNDE-:
Nondestructive Characterization of Materials XI : Proceedings of the 11th International Symposium on Nondestructive Characterization of Materials
Berlin: Springer, 2003
ISBN: 3-540-40154-7
S.775-780
International Symposium on Nondestructive Characterization of Materials <11, 2002, Berlin>
Englisch
Konferenzbeitrag
Fraunhofer IZFP ()
microscopic characterization; ferromagnetic material; photothermal method; photothermally modulated stray-field (PMS)

Abstract
The photothermally modulated stray-field (PMS) technique is used to image magnetic structures of ferri- and ferromagnetic materials with a few micrometer resolution. As detector for the thermally induced modulated magnetic stray-fields, miniaturized coils and sensors based on magnetoresitive effects are used. The technique is applied to image domain structures in amorphous metallic alloys. A unique property of the PMS technique is the ability for magnetic depth profiling, which is demonstrated for polycrystalline pure nickel. Practical advantages are the small lift-off effect and the low sample preparation requirements.

: http://publica.fraunhofer.de/dokumente/N-18027.html