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A single chip broadband noise source for noise measurements at cryogenic temperatures

: Bruch, D.; Schäfer, F.; Seelmann-Eggebert, M.; Aja, B.; Kallfass, I.; Leuther, A.; Schlechtweg, M.; Ambacher, O.


IEEE Microwave Theory and Techniques Society:
IEEE MTT-S International Microwave Symposium, IMS 2011 : June 5 - 10, 2011, Baltimore Convention Center
New York, NY: IEEE, 2011
ISBN: 978-1-61284-754-2 (Print)
ISBN: 978-1-61284-757-3
ISBN: 978-1-61284-756-6 (Online)
4 S.
International Microwave Symposium (IMS) <2011, Baltimore/Md.>
Fraunhofer IAF ()
cryogenic amplifier; GaAs; low noise amplifier; LNA; MMIC; noise temperature

This paper presents the design and performance of a single chip broadband noise source dedicated for on-chip measurements in a cryogenic environment. The noise source is used to generate the two input noise powers Pc and Ph which are required by the commonly used Y-factor method. High accuracy in temperature control and impedance presented to the device under test is achieved over a wide temperature range from 7 K to 100 K. Noise temperature measurements of a cryogenic low noise amplifier were performed on-chip and show a typical accuracy of ±1 K.