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On the quantification of the state-of-the-art models for skin-effect in conductors, including those with non-rectangular cross-sections

: Curran, B.; Ndip, I.; Guttowski, S.; Reichl, H.


Institute of Electrical and Electronics Engineers -IEEE-:
IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 : Austin, Texas, USA, 17 - 21 August 2009
Piscataway, NJ: IEEE, 2009
ISBN: 978-1-4244-4266-9 (print)
ISBN: 978-1-4244-4267-6 (online)
International Symposium on Electromagnetic Compatibility (EMC) <2009, Austin/Tex.>
Fraunhofer IZM ()

Predictability of transmission line parameters in both the frequency and time-domains is very important for microelectronics packaging. Proximity effects and non-rectangular cross-sections can cause a drastic deviation in transmission line parameters from the theoretically calculated values. Filament models and full-wave techniques have offered improvements over analytical models for computing the parameters of transmission lines with arbitrary cross-sections including proximity effects. This work is an analysis of some state-of-the-art skin-effect models and a quantification of their limitations.