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Efficient texture analysis of binary images

: Ohser, J.; Steinbach, B.; Lang, C.


Journal of microscopy 192 (1998), Nr.1, S.20-28
ISSN: 0022-2720
Fraunhofer ITWM ()

A new method of determining some characteristics of binary images is proposed based on a special linear filtering. This technique enables estimation of the area fraction, the specific line length and the specific integral of curvature. Furthermore, the specific length of the total projection is obtained, which gives detailed information about the texture of the image. The influence of lateral and directional resolution depending on the size of the applied filter mask is discussed in detail. The technique includes a method of increasing directional resolution for texture analysis while keeping lateral resolution as high as possible.