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Combination of analytical models and order reduction methods for system level modeling of gyroscopes

 
: Schneider, P.; Reitz, S.; Bastian, J.; Schwarz, P.; Döring, C.; Maute, M.; Neul, R.

Nano Science and Technology Institute -NSTI-:
NSTI Nanotechnology Conference and Trade Show 2005. Vol.3: ICCN, MSM : NSTI Nanotech 2005, May 8 - 12, 2005, Anaheim Marriott & Convention Center, Anaheim, California, USA
Cambridge, Mass. [u.a.]: NSTI, 2005
ISBN: 0-9767985-4-9
S.616-619
Nanotechnology Conference and Trade Show (Nanotech) <2005, Anaheim/Calif.>
Englisch
Konferenzbeitrag
Fraunhofer IIS ()

Abstract
Within the design process of complex sensor systems different physical effects and electronic circuits for signal processing have to be analyzed. A simulation of the entire system including models for micromechanics and field effects based on partial differential equations is often impossible or too expensive concerning computing time. Furthermore, many details of component behavior calculated by Finite Element Method (FEM) are not needed at system level. In this paper we describe an approach for system level simulation of sensor systems and its application to a gyro sensor system.

: http://publica.fraunhofer.de/dokumente/N-170863.html