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Relevant information sources for successful technology transfer: A survey using inspections as an example

 
: Jedlitschka, A.; Ciolkowski, M.; Denger, C.; Freimut, B.; Schlichting, A.

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Institute of Electrical and Electronics Engineers -IEEE-:
First International Symposium on Empirical Software Engineering and Measurement, ESEM 2007. Proceedings : September 20-21, 2007, Madrid, Spain
Los Alamitos: IEEE Computer Society, 2007
ISBN: 978-0-7695-2886-1
ISBN: 0-7695-2886-4
ISSN: 1938-6451
S.31-40
International Symposium on Empirical Software Engineering and Measurement (ESEM) <1, 2007, Madrid>
Englisch
Konferenzbeitrag
Fraunhofer IESE ()

Abstract
A systematic approach to decision making in software engineering is required, for instance, if an organization aims at achieving CMMI level three. Rational decision making regarding the selection and introduction of SE technologies requires adequate information about their suitability for the intended organizational context. Research is often unable to provide such information, and this could be one reason why promising techniques are sometimes not adopted in practice. From a research point of view, successful technology transfer requires knowing which information decision makers in industry need, and where they actually look for it. With this knowledge, empirical research can strive to produce the needed information in order to increase the likelihood of successful technology adoption. To address these questions, we conducted an online survey among German software industry decision makers. To focus the survey, we used inspections as an exemplary technology. We invited 9653 companies to participate, from which we received 92 fully completed questionnaires. Our main findings are that information regarding the impact of technologies on product quality, cost, and development time, as well as on technology cost-benefit ratio is considered most important among decision makers. The preferred sources of information are colleagues, textbooks, and industry workshops.

: http://publica.fraunhofer.de/dokumente/N-170440.html