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Development and verification of a material model for adhesives under crash loading

 
: Andrieux, F.; Memhard, D.; Sun, D.-Z.

Khan, A.S.:
Macro-to-nano-scale inelastic of materials, plasticity, fatigue & fracture. The 15th International Symposium on Plasticity & its Current Applications. CD-ROM : Jan. 3 - 8, 2009, St. Thomas, U. S. Virgin Island
Fulton, Md.: NEAT Press, 2009
ISBN: 0-9659463-9-8
International Symposium on Plasticity and its Current Applications <15, 2009, St.Thomas>
Englisch
Konferenzbeitrag
Fraunhofer IWM ()

: http://publica.fraunhofer.de/dokumente/N-145962.html