English
Deutsch
Log In
Password Login
or
Log in with Fraunhofer Smartcard
Research Outputs
Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Konferenzschrift
FD SOI MOSFET compact modeling including process variations
Details
Full
Export
Statistics
Options
2010
Conference Paper
Titel
FD SOI MOSFET compact modeling including process variations
Author(s)
Kampen, C.
Burenkov, A.
Lorenz, J.
Ryssel, H.
Hauptwerk
11th International Conference on Ultimate Integration on Silicon, ULIS 2010. Proceedings
Konferenz
International Conference on Ultimate Integration on Silicon (ULIS) 2010
Language
English
google-scholar
View Details
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB