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Micro-luminescence spectroscopy on multicrystalline silicon

: Gundel, P.; Schubert, M.C.; Kwapil, W.; Schön, J.; Reiche, M.; Savin, H.; Yli-Koski, M.; Sans, J.A.; Martinez-Criado, G.; Warta, W.; Weber, E.R.

Volltext urn:nbn:de:0011-n-1433088 (828 KByte PDF)
MD5 Fingerprint: 86405b0b7c077049fedd921d6168a770
Erstellt am: 31.8.2012

Sinke, W. ; WIP - Renewable Energies, München; European Commission; UNESCO; World Council for Renewable Energy; International Photovoltaic Equipment Association:
24th European Photovoltaic Solar Energy Conference 2009. CD-ROM : The compiled State-of-the-Art of PV Solar Technology and Deployment. Proceedings of the International Conference held in Hamburg, 21-25 September 2009
München, 2009
ISBN: 3-936338-25-6
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <24, 2009, Hamburg>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()

The luminescence of silicon has been used for many applications such as lifetime measurements and defect characterization in multicrystalline silicon for solar cells. In this paper we demonstrate new applications of luminescence spectroscopy for the characterization of multicrystalline silicon which are based on a very high spatial resolution in the order of one ?m. These applications are the detection of small metal precipitates, the qualitative measurement of internal stress and X-ray Excited Optical Luminescence for correlating of X-ray fluorescence measurements with the minority carrier diffusion length.