Options
1995
Journal Article
Titel
Simultaneous measurement of the linewidth, linewidth enhancement factor alpha , and FM and AM response of a semiconductor laser
Abstract
Using a commercially available computer controlled spectrum analyser with tracking generator, optical input section, and optical delay line it is possible to measure the linewidth, linewidth enhancement factor alpha , and FM and AM response of a semiconductor laser in one process. The determination of the linewidth yields also information about the frequency noise density and the determination of a delivers information about the nonlinear gain. Assuming an optical input power of 0 dBm, a laser linewidth <50 MHz and a modulation response of the laser without cut-off, AM indices m>0.01% and FM deviations of about >10 MHz up to 20 GHz can be detected.
Tags
-
amplitude modulation
-
frequency modulation
-
laser noise
-
laser variables measurement
-
nonlinear optics
-
optical modulation
-
physics computing
-
semiconductor device noise
-
semiconductor lasers
-
spectral analysers
-
spectral line breadth
-
simultaneous measurement
-
linewidth enhancement factor
-
fm response
-
am response
-
semiconductor laser
-
commercially available computer controlled spectrum analyser
-
tracking generator
-
optical input section
-
optical delay li
-
frequency noise density
-
nonlinear gain
-
optical input power
-
laser linewidth
-
modulation response