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Simultaneous measurement of the linewidth, linewidth enhancement factor alpha , and FM and AM response of a semiconductor laser

 
: Kruger, U.; Kruger, K.

:

Journal of Lightwave Technology 13 (1995), Nr.4, S.592-7
ISSN: 0733-8724
Englisch
Zeitschriftenaufsatz
Fraunhofer HHI ()
amplitude modulation; frequency modulation; laser noise; laser variables measurement; nonlinear optics; optical modulation; physics computing; semiconductor device noise; semiconductor lasers; spectral analysers; spectral line breadth; simultaneous measurement; linewidth enhancement factor; fm response; am response; semiconductor laser; commercially available computer controlled spectrum analyser; tracking generator; optical input section; optical delay li; frequency noise density; nonlinear gain; optical input power; laser linewidth; modulation response

Abstract
Using a commercially available computer controlled spectrum analyser with tracking generator, optical input section, and optical delay line it is possible to measure the linewidth, linewidth enhancement factor alpha , and FM and AM response of a semiconductor laser in one process. The determination of the linewidth yields also information about the frequency noise density and the determination of a delivers information about the nonlinear gain. Assuming an optical input power of 0 dBm, a laser linewidth <50 MHz and a modulation response of the laser without cut-off, AM indices m>0.01% and FM deviations of about >10 MHz up to 20 GHz can be detected.

: http://publica.fraunhofer.de/dokumente/N-13460.html