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3*10 Gbit/s, 100 km data transmission based an sliced spectrum signal generation using a single tunable mode locked semiconductor laser pulse source

 
: Ludwig, R.; Pieper, W.; Langenhorst, R.; Weber, H.G.

Interuniversity Micro-Electronics Center -IMEC-, Louvain:
21st European Conference on Optical Communication, ECOC '95. Proceedings. Vol.2: Regular papers & invited papers : Including Symposium on Photonic versus Electronic Technologies in Switching and Interconnection, Symposium on Broadband Networks for Video and Multimedia Services, ECOC 95 EEOC, Brussels, Belgium, 17 - 21 September 1995
Piscataway, NJ: IEEE, 1995
ISBN: 90-9008471-1
ISBN: 0-7803-2938-4
S.829-832
European Conference on Optical Communication (ECOC) <21, 1995, Brüssel>
Symposium on Photonic versus Electronic Technologies in Switching and Interconnection <1995, Brüssel>
Symposium on Broadband Networks for Video and Multimedia Services <1995, Brüssel>
European Exhibition on Optical Communication (EEOC) <1, 1995, Brüssel>
Englisch
Konferenzbeitrag
Fraunhofer HHI ()
data communication; high-speed optical techniques; laser mode locking; laser tuning; optical fibre communication; optical fibre dispersion; optical fibre filters; semiconductor lasers; telecommunication channels; wavelength division multiplexing; data transmission; sliced spectrum signal generation; tunable mode locked semiconductor laser pulse source; semiconductor laser pulse source; tunable mode locked semiconductor lase; broadband spectrum; optical pulses; optical filters; wdm channels; error free transmission; dispersion shifted fiber; tunable filter; ber measurements; 100 km; 10 Gbit/s; 650 fs

Abstract
The broadband spectrum of 650 fs pulses of a mode locked semiconductor laser was sliced spectrally by three optical filters to define three 10 Gbit/s WDM channels. Error free transmission over 100 km of dispersion shifted fiber was achieved. A tunable filter enabled the selection of a desired channel. The corresponding BER measurements show a penalty of less than 1 dB as compared to the back-to-back measurements.

: http://publica.fraunhofer.de/dokumente/N-13285.html