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A Traceable Method for the Arc-free Characterization and Modeling of CDM testers and Pulse Metrology Chains

 
: Gieser, H.A.; Wolf, H.; Soldner, W.; Reichl, H.; Andreini, Antonio; Natarajan, Mahadeva Iyer; Stadler, Wolfgang

Greason, W.D. ; Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electron Devices Society:
EOS/ESD Symposium 2003. Papers presented at the 25th Annual International Electrical Overstress/Electrostatic Discharge Symposium : Held in Las Vegas, Nev., USA on September 21-25, 2003
Amsterdam: Elsevier, 2004 (Journal and electrostatics 62.2004, Nr.2/3)
328-337
Annual International Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) <25, 2003, Las Vegas/Nev.>
Englisch
Konferenzbeitrag
Fraunhofer IZM ()

Abstract
A traceable low-voltage network analysis in the time and frequency domain is introduced for the arcfree characterization of CDM testers and their metrology chains. An improved tester circuit model is derived from step responses.

: http://publica.fraunhofer.de/dokumente/N-122081.html