English
Deutsch
Log In
Password Login
or
Log in with Fraunhofer Smartcard
Research Outputs
Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Artikel
Reliablility of SnPb and Pb-Free Flip-Chips under Different Test Conditions
Details
Full
Export
Statistics
Options
2007
Journal Article
Titel
Reliablility of SnPb and Pb-Free Flip-Chips under Different Test Conditions
Author(s)
Spraul, M.
Nüchter, W.
Möller, A.
Wunderle, B.
Michel, B.
Zeitschrift
Microelectronics reliability
Language
English
google-scholar
View Details
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM