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Systematical pull and shear test investigations on very small bond loops (wire <= 25 µm) and innovative alloys
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2008
Conference Paper
Titel
Systematical pull and shear test investigations on very small bond loops (wire <= 25 µm) and innovative alloys
Author(s)
Schneider-Ramelow, M.
Göhre, J.
Hauptwerk
41st International Symposium on Microelectronics 2008
Konferenz
International Symposium on Microelectronics 2008
Language
English
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Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM