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Reliability Testing of Polytronics Components in the Micro-Nano Region

 
: Michel, B.; Dudek, R.; Walter, H.

:

Institute of Electrical and Electronics Engineers -IEEE-:
Polytronic 2005, 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. Proceedings : Hotel Mercure Panorama, Wroclaw, Poland 23-26 October 2005
New York, NY: IEEE, 2005
ISBN: 0-7803-9553-0
S.13-15
International Conference on Polymers and Adhesives in Microelectronics and Photonics (Polytronic) <5, 2005, Wroclaw>
Englisch
Konferenzbeitrag
Fraunhofer IZM ()

: http://publica.fraunhofer.de/dokumente/N-120398.html