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Condition Indicators for Reliability Monitoring of Microsystems
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2007
Conference Paper
Titel
Condition Indicators for Reliability Monitoring of Microsystems
Author(s)
Bochow-Ness, O.
Eckert, T.
Fujino, M.
Middendorf, A.
Reichl, H.
Hauptwerk
MicroNanoReliability 2007, 1st World Congress MicroNanoReliability
Konferenz
International Congress on Microreliability and Nanoreliability in Key Technology Applications (MNR) 2007
World Congress MicroNanoReliability 2007
Language
English
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Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM