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Yield improvement and defect control in Bridgman-type crystal growth with the aid of thermal modeling
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2008
Conference Paper
Titel
Yield improvement and defect control in Bridgman-type crystal growth with the aid of thermal modeling
Author(s)
Friedrich, J.
Hauptwerk
Crystal growth technology
Konferenz
International Workshop on Crystal Growth Technology 2005
Language
English
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Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB