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Determination of short-range order and interlayer extension in Fe/Al multilayers using XAFS

: Meyer, D.C.; Gawlitza, P.; Richter, K.; Paufler, P.


Journal of Physics. D. Applied Physics 32 (1999), S.3135-3139
ISSN: 0022-3727
Fraunhofer IWS ()
nm-Präzisionsschicht; Multischicht; Nanomaterialien; Grenzfläche

Short-range order in Fe/Al multilayers has been determined using Fe K fluorescence x-ray absorption fine structure (XAFS) experiments. The two multilayers studied (prepared by pulsed laser deposition) exhibited different Fe single layer thickness (4.3 nm and 30 nm, respectively) but comparable total amount of Fe (six thin and one thick layers, respectively). From XAFS signals arising at different regions of the sample it was concluded that a solid solution of Fe had been formed in the vicinity of the Fe/Al interface, the thickness of which was estimated to be 3.8 nm. The average Fe neighbourhood in these interface regions contained about 50% Al substituting for Fe.