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Near-surface residual stress-profiling with high frequency Eddy current conductivity measurement

 
: Hillmann, S.; Heuer, H.; Baron, H.-U.; Bamberg, J.; Yashan, A.; Meyendorf, N.

:

Thompson, D.O. ; American Institute of Physics -AIP-, New York:
Review of progress in quantitative nondestructive evaluation. Volume 28, Vol. B : The Annual Review of Progress in Quantitative NDE (QNDE). Chicago, Illinois, 20 - 25 July 2008
Melville, NY: AIP, 2009 (AIP Conference Proceedings 1096)
ISBN: 978-0-7354-0629-2
ISSN: 0094-243X
S.1349-1355
Annual Review of Progress in Quantitative Nondestructive Evaluation (NDE) <35, 2008, Chicago/Ill..>
Englisch
Konferenzbeitrag
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()

: http://publica.fraunhofer.de/dokumente/N-102272.html