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Near field scanning with optoelectronic E-field probes

 
: Kortke, A.; Mann, W.

European Association on Antennas and Propagation -EurAAP-:
EuCAP 2009, 3rd European Conference on Antennas and Propagation. Proceedings. CD-ROM : 23 - 27 March 2009, Berlin, Germany
Berlin: VDE-Verlag, 2009
ISBN: 978-3-8007-3152-7 (CD-ROM)
ISBN: 978-1-4244-4753-4 (Print)
ISBN: 978-3-00-024573-2 (Online)
S.1725-1729
European Conference on Antennas and Propagation (EuCAP) <3, 2009, Berlin>
Englisch
Konferenzbeitrag
Fraunhofer HHI ()
optoelectronic device

Abstract
Optoelectronic field probes are well suited for RF-near-field scanning purpose. Such field probes cause only very little back scattering of electromagnetic energy to the measured radiation source. In the paper the technique of planar near-field scanning is presented. The analysis of the back scattering effect is described. Moreover, a model of the probe polarization characteristic is presented. Finally, a numerical method of polarization correction for planar near field distribution functions is described, which utilizes the knowledge of the optoelectronic field probe polarization characteristic.

: http://publica.fraunhofer.de/dokumente/N-101950.html