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Soft X-ray projection system for robust roundness measurements
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2009
Conference Paper
Titel
Soft X-ray projection system for robust roundness measurements
Author(s)
Volk, R.
HOMMEL-ETAMIC GmbH
Neumann, E.
HOMMEL-ETAMIC GmbH
Warrikhoff, A.
rtw Röntgentechnik
Hanke, R.
Kasperl, S.
Funk, C.
Hiller, J.
Krumm, M.
Sudarsan, A.
Sukowski, F.
Uhlmann, N.
Behrendt, R.
Schmitt, R.
RWTH Aachen
Hamacher, A.
RWTH Aachen
Damm, B.
RWTH Aachen
Hauptwerk
Optical Measurement Systems for Industrial Inspection VI
Konferenz
Conference "Optical Measurement Systems for Industrial Inspection" 2009
DOI
10.1117/12.827330
Language
English
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