Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Advanced characterization techniques for optics, semiconductors, and nanotechnologies
3 - 5 August 2003, San Diego, California, USA
: Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.
| Bellingham/Wash.: SPIE, 2003
SPIE Proceedings Series, 5188
Conference on Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies <2003, San Diego/Calif.>
ISBN: 0-8194-5061-8 |
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| Englisch |
| Tagungsband |
| Fraunhofer IOF () |