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Recombination lifetimes of iron-contaminated silicon wafers: Characterization using a single set of capture cross-sections
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2002
Journal Article
Titel
Recombination lifetimes of iron-contaminated silicon wafers: Characterization using a single set of capture cross-sections
Author(s)
Rommel, M.
Zoth, G.
Ullrich, M.
Ryssel, H.
Zeitschrift
Diffusion and defect Data. B, Solid State Phenomena
DOI
10.4028/www.scientific.net/SSP.82-84.373
Language
English
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