English
Deutsch
Log In
Password Login
or
Log in with Fraunhofer Smartcard
Research Outputs
Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Buch
High-resolution X-ray scattering from thin films and multilayers
Details
Full
Export
Statistics
Options
1999
Book
Titel
High-resolution X-ray scattering from thin films and multilayers
Author(s)
Holy, V.
Pietsch, U.
Baumbach, T.
Verlag
Springer
Verlagsort
Berlin
Language
English
google-scholar
View Details
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP