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Micro-raman investigation of InAsBi epilayers grown by MOVPE
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2000
Conference Paper
Titel
Micro-raman investigation of InAsBi epilayers grown by MOVPE
Author(s)
Verma, P.
Herms, M.
Irmer, G.
Okamoto, H.
Oe, K.
Yamada, M.
Hauptwerk
Defects - recognition, imaging and physics in semiconductors 1999. Proceedings
Konferenz
International Conference on Defects in Semiconductors 1999
Language
English
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Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP