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Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions
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1999
Conference Paper
Titel
Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions
Author(s)
Mergens, M.
Wilkening, W.
Mettler, S.
Wolf, H.
Stricker, A.
Fichtner, W.
Hauptwerk
Electrical Overstress/Electrostatic Discharge Symposium 1999. Proceedings
Konferenz
Electrical Overstress Electrostatic Discharge Symposium 1999
DOI
10.1109/EOSESD.1999.818983
Language
English
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Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM