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Development of diamond films for particle detector applications

 
: Behnke, T.; Oh, A.; Wagner, A.; Zeuner, W.; Bluhm, A.; Klages, C.-P.; Paul, M.; Schäfer, L.

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Diamond and Related Materials 7 (1998), No.10, pp.1553-1557
ISSN: 0925-9635
English
Journal Article
Fraunhofer IST ()
charge collection; Diamantschicht; diamond film; electronic property; elektronische Eigenschaft; grain boundary; impurities; Korngrenze; particle detector; priming; Teilchendetektor; Verunreinigung; CVD diamond; detector application; priming

Abstract
The material properties of chemical vapour deposited (CVD) diamond such as its high resistance against radiation make diamonds an attractive material for development of particle detectors. For such an application the charge collection properties have to be optimised. The paper reviews a study of the dependence of charge collection properties on growth parameters of a microwave plasma CVD process. The charge collection efficiency and the priming parameters of several deposition experiments are studied and correlated to growth parameters.

: http://publica.fraunhofer.de/documents/PX-9604.html