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Determination of residual stress by time-of-flight measurements with linear polarized shear waves. Paper AA-1

 
: Schneider, E.; Goebbels, K.; Huebschen, G.; Salzburger, H.J.

Institute of Electrical and Electronics Engineers -IEEE-:
Ultrasonics Symposium 1981. Proceedings
Piscataway/N.J., 1981
pp.956-959
Ultrasonics Symposium <1981, Chicago/Ill.>
English
Conference Paper
Fraunhofer IZFP ()

: http://publica.fraunhofer.de/documents/PX-9458.html