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The dependence of reverse characteristics of high voltage devices passivated by semi-insulating polycrystalline silicon on an interfacial thin film
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1991
Journal Article
Titel
The dependence of reverse characteristics of high voltage devices passivated by semi-insulating polycrystalline silicon on an interfacial thin film
Author(s)
Schulze, G.H.
Burte, E.P.
Zeitschrift
Thin solid films
Language
English
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