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Defect classification and imaging with phased array techniques

 
: Bonitz, F.; Gebhardt, W.; Schmitz, V.

DARPA/AF Review of Progress in Quantitative NDE, July 8.-13.1979, La Jolla/Calif., Proceedings
1980
English
Book Article
Fraunhofer IZFP ()

: http://publica.fraunhofer.de/documents/PX-9072.html