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Corrosion tests in artificial atmosphere with SO2 and H2S

Korrosionstests in künstlicher Atmosphäre mit SO2 und H2S
 
: Reichert, T.F.; Ziegahn, K.-F.

Electrochemical Society -ECS-:
2nd International Symposium on Corrosion and Reliability of Electronic Materials and Devices '92 : Held at the Electrochemical Society Meeting in Toronto
Pennington/N.J., 1993 (Electrochemical Society. Proceedings 93-1)
ISBN: 1-56677-051-3
pp.364-373
International Symposium on Corrosion and Reliability of Electronic Materials and Devices <2, 1992, Toronto>
English
Conference Paper
Fraunhofer ICT ()
air pollution; atmospheric corrosion; connector material; corrosive layer; electronic interface card; environmental testing; H2S; SO2

Abstract
Connector materials like IC-pins, the IC-socket materials, the solder connections etc. were observed by the use of interference lightmicroscopy, scanning electron microscopy with x-ray-analysis and x-ray-spectrography to detect the structure of the corrosion layer after atmospheric corrosion tests with SO2 and H2S. Most of the invesitgations were done on grindings of the solded pins or soldering spots.

: http://publica.fraunhofer.de/documents/PX-8737.html