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1994
Conference Paper
Title

Contour analysis algorithms for high speed inspection

Abstract
The visual inspection of many industrial products is based on contour analysis. The main task is the detection of defects like cracks and chips. The automation of this visual inspection procedure requires robust and flexible systems and algorithmus. This paper describes new contour analysis algorithms for defect detection. Innovative techniques for contour filtering and analysis (e.g. scale-space analysis) will be presented. The performance of different approaches is shown by several industrial examples and applications.
Author(s)
Kille, K.
Mainwork
Automated 3D and 2D Vision  
Conference
Conference on Industrial Applications of Laser Radar 1994  
Conference on Automated Visual Inspection 1994  
Language
English
Fraunhofer-Institut für Produktionstechnik und Automatisierung IPA  
Keyword(s)
  • Algorithmus

  • High Speed inspection

  • Hochgeschwindigkeit

  • Hochgeschwindigkeitsprüfung

  • Hochgeschwindigkeitstechnologie

  • inspection

  • Kontur

  • Visuelle Prüfung

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