Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. CMOS integrated capacitive pressure transducer with on-chip electronics and digital calibration
| Institute of Electrical and Electronics Engineers -IEEE-:
Transducers '91. 6th International Conference on Solid-State Sensors and Actuators. Digest of technical papers
New York/N.Y., 1991
ISBN: 0-87942-585-7
pp.304-307 |
| International Conference on Solid-State Sensors and Actuators <6, 1991, San Francisco/Calif.> |
|
| English |
| Conference Paper |
| Fraunhofer IMS () |
| kapazitiver Drucksensor; Mikrosystem; Sensor-Elektronik; Sensorsystem |
Abstract
A capacitive pressure sensor with CMOS switched-capacitor circuitry for on-chip signal conditioning is introduced. It features differential generation and treatment of pressure-induced capacitance changes to suppress various parasitic effects. A digital calibration capability is provided in the form of a programmable capacitor array. The fabrication of the transducer is largely congruent with a standard n-well CMOS process. The paper explains the functioning of the circuitry and its implications for the sensor design and presents experimental results obtained in testing the various components of the transducer.