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  4. A charge-sheet capacitance model based on drain current modeling
 
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1990
Journal Article
Title

A charge-sheet capacitance model based on drain current modeling

Abstract
Based upon a common charge-sheet approach analytical models of the drain current and the capacitances of a MOSFET are formulated. Mobility reduction due to velocity saturation and the interface scattering of carriers is taken into account. A saturation criterion is developed from the condition of output conductance continuity. The capacitance modeling requires no additional parameters not contained in the dc model. The comparison with measurement confirms the theory to be useful for analog circuit simulation down to channel lengths of about 1 fm.
Author(s)
Budde, W.
Lamfried, W.H.
Journal
IEEE transactions on electron devices  
DOI
10.1109/16.55755
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • device modeling

  • MOSFET

  • short channel

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