Characterization of vapor phase deposited organic molecules on silicon surfaces

Thin films of 2,4,6-tris-(2,2-bisphenyl-propane)-1,3,5-triazine (p-CPC-trimer), deposited on clean, oxidized and H20-saturated Si(100) surfaces, have been investigated by X-ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS), Metastable Impact Electron Spectroscopy (MIES) and Atomic Force Microscopy (AFM). The spectroscopic results indicate a preferential molecular orientation due to the interaction of the trioxytriazine rings with the substrate surfaces. The study of the surface topograpy during film formation exhibits characteristic two dimensional domain patterns caused by a self-organization process.