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Characterization of the elastic behavior of nanocrystalline materials by scanning acoustic microscopy

Beschreibung des elastischen Verhaltens von nanokristallinem Werkstoff mit dem akustischen Reflexionsrastermikroskop
 
: Korn, D.; Gleiter, H.; Hoppe, M.; Arnold, W.; Morsch, A.

Höller, P. ; Deutsche Gesellschaft für Zerstörungsfreie Prüfung e.V. -DGZfP-, Berlin:
Nondestructive Characterization of Materials III
Berlin/West: Springer, 1989
ISBN: 3-540-51856-8
pp.384-390
International Symposium on Nondestructive Characterization of Materials <3, 1988, Saarbrücken>
English
Conference Paper
Fraunhofer IZFP ()
akustische Rastermikroskopie; Nanokristall

Abstract
The V(z)-measurement technique in Scanning Acoustic Microscopy (SAM) was used for an attempt to characterize the elastic behavior of nanocrystalline materials that are polycrystals whose grain sizes comprise a range from 1 to 100 nm. From the periodicity of the V(z)-curves the velocities of surface waves can be deduced. We present the results of such measurements on nanocrystalline Pd-samples which were performed with the Ernst-Leitz SAM at 1.0 and 1.6 GHz. We interprete the observed periodicity as caused by a skimming compressional wave. The deduced phase velocity is about 30% lower than the velocity of compressional bulk waves as determined by time of flight measurements.

: http://publica.fraunhofer.de/documents/PX-7552.html