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Characterization of SiO2 protective coatings on polycarbonate

 
: Jakobs, S.; Schulz, U.; Duparre, A.; Kaiser, N.

:

Fresenius Journal of Analytical Chemistry 358 (1997), pp.242-244
ISSN: 0937-0633
English
Journal Article
Fraunhofer IOF ()
atomic force microscope; Dünne optische Schicht; Lichtstreuung; light scattering; Oberflächenrauheit; optical thin films; Rasterkraftmikroskopie; surface roughness

Abstract
SiO2 protective coatings have been deposited on polycarbonate substrates by plasma ion assisted deposition. The influence of ion energy on the water permeability and the surface toptgraphy of the coatings was studied by infrared spectroscopy and atomic force microscopy. Coatings deposited at sufficiently high ion energies show a barrier effect against moisture uptake and considerably reduced film roughness. Both effects are attributed to an increase of the packing densities of the coatings.

: http://publica.fraunhofer.de/documents/PX-7546.html