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  4. Characterization of picosecond GaAs metal-semiconductor-metal photodetectors.
 
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1991
Conference Paper
Title

Characterization of picosecond GaAs metal-semiconductor-metal photodetectors.

Other Title
Charakterisierung von Pikosekunden-GaAs Metall-Halbleiter-Metall-Photodetektoren
Abstract
Interdigitated GaAs metal-semiconductor-metal Schottky photodiodes have been studied experimentally and theoretically. The time evolution of the response current has been measured by means of photoconductive and electrooptic sampling with a time resolution of 0.8 and 0.3 ps, respectively. The response current to a 70 fs laser pulse reaches maximum within 2-5 ps, then shows a fast decay of about 10 ps followed by a slower one. Self-consistent, two-dimensional Monte Carlo particle simulation predicts that the former is due to electrons, the latter to holes. With a sufficiently strong electric field the two species of carriers get separated. With increased light intensity a screened plasma forms that vanishes only through recombination which takes of the order of nanoseconds.
Author(s)
Axmann, A.
Schneider, J.
Hülsmann, A.
Lambsdorff, M.
Kuhl, J.
Klingenstein, M.
Leier, H.
Forchel, A.
Moglestue, C.
Rosenzweig, Josef  
Mainwork
Physical concepts of materials for novel optoelectronic device applications. Vol. 2: Device physics and applications  
Conference
International Conference on Physical Concepts of Materials for Novel Optoelectronic Device Applications 1990  
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • GaAs

  • Korrelationsmeßtechnik

  • metal-semiconductor-metal photodetector

  • Metall-Halbleiter-Metall-Photodetektor

  • Monte Carlo methods

  • photodiode

  • picosecond

  • Pikosekunde

  • sampling

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