A case study for XPD in the presence of a compositional depth profile - interface formation between metals -Ag, Al- and HgCdTe.

We demonstrate how to complete set of angle-resolved photoemission data for all atomic constituents of a sample can be evaluated independently to obtain information of the depth profile as well as on the crystalline order. Substrate order and segregational effects observed at the onset of metallizing Hg1-xCdxTe(111)B(x = 1 and 0.22) surfaces with Ag or Al, respectively, are analyzed and presented as examples.