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  4. Carrier profile for In(0.35)Ga(0.65)As/GaAs multiquantum well lasers from capacitance-voltage measurements
 
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1996
Journal Article
Title

Carrier profile for In(0.35)Ga(0.65)As/GaAs multiquantum well lasers from capacitance-voltage measurements

Other Title
Aus Kapazität-Spannungsmessungen bestimmtes Ladungsträgerprofil in In(0.35)Ga(0.65)As/GaAs Mehrfach-Quantumfilm-Lasern
Abstract
The carrier profile for MBE grown ln(ind 0,35)Ga(ind 0.65)As/GaAs multiquantum well laser structures with nominally undoped and beryllium-doped active regions was determined by using the capacitance- voltage (C-V) technique at room temperature. A simple theoretical model was used to extract the impurity concentration and the quantum-well carrier density from the experimental profiles. We obtained a high carrier concentration in nominally undoped devices caused by a strong growth temperature dependent Be diffusion from the p-cladding layer, and no difference between doped samples with different nominal dopant location.
Author(s)
Arias, J.
Esquivias, I.
Ralston, J.D.
Larkins, E.C.
Weisser, S.
Rosenzweig, Josef  
Schönfelder, A.
Maier, M.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Applied Physics Letters  
DOI
10.1063/1.115738
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • carrier density profile

  • impurity concentration

  • InGaAs/GaAs

  • Ladungsträgerdichte-Profil

  • MBE

  • Mehrfach-Quantenfilm

  • quantum wells

  • Störstellenkonzentration

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